Electrical Overstress (Eos). Devices, Circuits And Systems

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Electrical Overstress (EOS) continues to impact semiconductor manufacturing, semiconductor components and systems as technologies scale from micro- to nano-electronics

It is an essential reference and a useful insight into the issues that confront modern technology as we enter the nano-electronic era.

It provides an illuminating insight into the sources of EOS in manufacturing, integration of on-chip, and system level EOS protection networks, followed by examples in specific technologies, circuits, and chips

Look inside for extensive coverage on Fundamentals of electrical overstress, from EOS physics, EOS time scales, safe operating area SOA , to physical models for EOS phenomena EOS sources in today s semiconductor manufacturing environment, and EOS program management, handling and EOS auditing processing to avoid EOS failures EOS failures in both semiconductor devices, circuits and system Discussion of how to distinguish between EOS events, and electrostatic discharge ESD events e.g

The book is unique in covering the EOS manufacturing issues from on-chip design and electronic design automation to factory-level EOS program management in today s modern world

The text provides a clear picture of EOS phenomena, EOS origins, EOS sources, EOS physics, EOS failure mechanisms, and EOS on-chip and system design

This bookteaches the fundamentals of electrical overstress and how to minimize and mitigate EOS failures

Such as human body model HBM , charged device model CDM , cable discharge events CDM , charged board events CBE , to system level IEC 61000-4-2 test events EOS protection on-chip design practices and how they differ from ESD protection networks and solutions Discussion of EOS system level concerns in printed circuit boards PCB , and manufacturing equipment Examples of EOS issues in state-of-the-art digital, analog and power technologies including CMOS, LDMOS, and BCD EOS design rule checking DRC , LVS, and ERC electronic design automation EDA and how it

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